InGaAs Series
Attribute | Value |
---|---|
Reference | Observation of strain-enhanced electron-spin polarization in photoemission from InGaAs |
Photocathode | InGaAs |
Property | QE |
Datapoint Count | 87 |
Metadata
Name | Value |
---|---|
comment | 0.1 um thick |
Attribute | Value |
---|---|
Reference | Observation of strain-enhanced electron-spin polarization in photoemission from InGaAs |
Photocathode | InGaAs |
Property | QE |
Datapoint Count | 87 |
Name | Value |
---|---|
comment | 0.1 um thick |