InGaAs Series
| Attribute | Value |
|---|---|
| Reference | Observation of strain-enhanced electron-spin polarization in photoemission from InGaAs |
| Photocathode | InGaAs |
| Property | QE |
| Datapoint Count | 59 |
Metadata
| Name | Value |
|---|---|
| comment | 1.14 um thick sample |
| Attribute | Value |
|---|---|
| Reference | Observation of strain-enhanced electron-spin polarization in photoemission from InGaAs |
| Photocathode | InGaAs |
| Property | QE |
| Datapoint Count | 59 |
| Name | Value |
|---|---|
| comment | 1.14 um thick sample |